Applied Scanning Probe Methods XII: Characterization by Bharat Bhushan, Harald Fuchs PDF

By Bharat Bhushan, Harald Fuchs

ISBN-10: 3540850384

ISBN-13: 9783540850380

The volumes XI, XII and XIII study the actual and technical starting place for fresh growth in utilized scanning probe ideas. the 1st quantity got here out in January 2004, the second one to fourth volumes in early 2006 and the 5th to 7th volumes in past due 2006. the sector is progressing so quick that there's a desire for a collection of volumes each 12 to 18 months to catch most modern advancements. those volumes represent a well timed complete assessment of SPM functions. After introducing scanning probe microscopy, together with sensor expertise and tip characterization, chapters on use in quite a few commercial functions are provided. commercial purposes span topographic and dynamical floor reviews of thin-film semiconductors, polymers, paper, ceramics, and magnetic and organic fabrics. The chapters were written via major researchers and alertness scientists from around the world and from numerous industries to supply a broader point of view.

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Extra resources for Applied Scanning Probe Methods XII: Characterization (NanoScience and Technology) (No. XII)

Sample text

285 Novel Nanoindentation Techniques and Their Applications Jiping Ye . . . . . . . . . . . . . . . . 309 36 XLIV 37 38 Contents – Volume X Applications to Nano-Dispersion Macromolecule Material Evaluation in an Electrophotographic Printer Yasushi Kadota . . . . . . . . . . . . . . 347 Automated AFM as an Industrial Process Metrology Tool for Nanoelectronic Manufacturing Tianming Bao, David Fong, Sean Hand . . . . . . . . 359 List of Contributors – Volume XII N.

309 36 XLIV 37 38 Contents – Volume X Applications to Nano-Dispersion Macromolecule Material Evaluation in an Electrophotographic Printer Yasushi Kadota . . . . . . . . . . . . . . 347 Automated AFM as an Industrial Process Metrology Tool for Nanoelectronic Manufacturing Tianming Bao, David Fong, Sean Hand . . . . . . . . 359 List of Contributors – Volume XII N. it Enzo J. ch Yves F. be Robert H. Eibl Plainburgstr. be List of Contributors – Volume XII XLVII Hongjun Gao Nanoscale Physics & Devices Laboratory, Institute of Physics, Chinese Academy of Sciences, P.

Schäffer . . . . . . . . . . . . . . 51 Q-controlled Dynamic Force Microscopy in Air and Liquids Hendrik H¨olscher, Daniel Ebeling, Udo D. Schwarz . . . . 75 High-Frequency Dynamic Force Microscopy Hideki Kawakatsu . . . . . . . . . . . . . . 99 Torsional Resonance Microscopy and Its Applications Chanmin Su, Lin Huang, Craig B. Prater, Bharat Bhushan . . . 113 Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy Yaxin Song, Bharat Bhushan . . . . . .

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Applied Scanning Probe Methods XII: Characterization (NanoScience and Technology) (No. XII) by Bharat Bhushan, Harald Fuchs


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